461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to detemine the forces required to insert contacts into and remove contacts from their normal position in a connector.
DLA
Method
1 / A
Cancelled
This test determines the ability of parts to resist extremely high and low temperatures, as well as their ability to withstand cyclical exposures to these temperature...
DLA
Method
A /
Canceled
This test method establishes the procedure for classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to...
DLA
Method
6 / A w/Change4
Active
The purpose of this test is to prove that a given electrical connector or coaxial contacts can operate safely at its rated voltage and withstand momentary...
DLA
Method
1 / A
Cancelled
Samples were tested at low and high dose rate under biased and unbiased conditions, as outlined in MIL-STD-883 Test Method 1019, to a total dose of 100krad(Si) at LDR...
TD
/
Active
The purpose of this test is to measure the holding current of the device under the specified conditions.
DLA
Method
2 / w/Change3
Active
The purpose of this test is to measure the noise figure of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
This method establishes the means for measuring the power dissipation and output impedance.
DLA
Method
1 /
Active
This method provides means for establishing or evaluating the maximum capabilities of microelectronic devices, including such capabilities as absolute maximum ratings...
DLA
Method
/
Active
The purpose of this test is to measure the SWR of the device at the local oscillator terminals.
DLA
Method
1 / w/Change3
Active