460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
It is the purpose of this test to determine the percentage change in direct-current (dc) ohmic resistance from the dc ohmic resistance at the reference temperature,...
DLA
Method
/
Active
This test method covers a method of measuring case temperature of hex-base semiconductor devices.
DLA
Method
1 / A w/Change4
Active
The purpose of this test is to determine the mechanical strength of the crimped contact to conductor joint.
DLA
Method
1 / A
Cancelled
The purpose of this test is to define a way for verifying the diode recovery stress capability of power MOSFET transistors. The focus is on simplicity and practicality.
DLA
Method
/ w/Change1
Active
This section describes detailed requirements for a DPA of commonly used inductors, transformers, and coils (MIL-PRF-27, MIL-PRF-15305, MIL-PRF-21038, MIL-PRF-39010,...
DLA
Method
/ C
Active
The purpose of the test is to measure the reverse transfer admittance under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active
The purpose of this method establishes a basic test circuit for the purpose of determining the 1 dB compression point of a gallium arsenide FET.
DLA
Method
/ w/Change1
Active
The purpose of this test is to detemine the forces required to insert contacts into and remove contacts from their normal position in a connector.
DLA
Method
1 / A
Cancelled
This test determines the ability of parts to resist extremely high and low temperatures, as well as their ability to withstand cyclical exposures to these temperature...
DLA
Method
A /
Canceled