460 results found for MIL-STD

The purpose of this examination is to verify that the external physical dimensions of the device are in accordance with the applicable acquisition document.

The purpose of this test method is for measuring a temperature-sensitive static parameter under conditions such that the product of the applied voltage and current at...

This test procedure defines the requirements for testing packaged semiconductor integrated circuits for ionizing radiation (total dose) effects from a cobalt-60 (60Co)...

This method provides a test for determining the integrity of pin-grid type package leads by measuring the capability of the package leads to withstand an axial force.

HS1840ARH 16-channel. Parts were tested at low and high dose rate under biased and unbiased conditions as outlined in MIL-STD-883 Test Method 1019.7, to a maximum...

The purpose of this test establishes the means for measuring MOSFET threshold voltage. This method applies to both enhancement-mode and depletion-mode MOSFETs, and for...

total dose test of the HS-OP470ARH.Parts were tested at low and high dose rate under biased and unbiased conditions as outlined in MIL-STD-883 Test Method 1019.7,to a...

The purpose of this test is to check the internal materials, construction, and workmanship of microcircuits for compliance with the requirements of the applicable...

This test is to measure the resistance offered by the insulating members of a component part to an impressed direct voltage tending to produce a leakage of current...

This test method is conducted to determine the resistance of the semiconductor device to sudden exposure to extreme changes in temperature and to the effect of...