460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Qualify TeamQuest Technology, Inc.as an additional site for Burn-in and Group C High Temp Operating Life Test (HTOL) processes for Military and Aerospace products...
Alert Documents
/ D
Active
The purpose of this test is to verify the boundary of the Safe Operating Area (SOA) of a transistor as constituted by the interdependency of the specified voltage,...
DLA
Method
/ w/Change1
Active
This purpose of this test is to verify a desired junction temperature (TJ) is achieved during burn-in and life-test environments, and is conducted on a representative...
DLA
Method
/ w/Change1
Active
The purpose of this test method is to establish the capability of axial lead glass body diodes to be free of intermittents or opens when measured in the forward mode...
DLA
Method
2 / A w/Change5
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the voltage between the collector and emitter of the device under specified conditions.
DLA
Method
/ w/Change1
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the gate reverse current of the field effect transistor or IGBT under the specified conditions.
DLA
Method
1 / w/Change1
Active
This test is conducted to determine the suitability of connectors and connector assemblies when subjected to shocks such as those expected from rough handling,...
DLA
Method
1 / A
Cancelled
The purpose of this test is to determine the thermal resistance of lead, case, or surface mounted diodes under the specified conditions.
DLA
Method
4 / w/Change3
Active