460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Aeroflex is proceeding with migrating the UT63M147 MIL-STD-1553A/B Bus Transceivers (5962-93226), to a new wafer fabrication facility. As a result of the wafer foundry...
Alert Documents
18/07/2018 /
Active
The purpose of this test is to measure the base to emitter voltage of the device in either a saturated or nonsaturated condition.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the time required for the junction to reach 63.2 percent of the final value of TJ change following application of a step...
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the input resistance of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...
TD
/ 0
Active
The purpose of this test is to evaluate existing SWR of connectors, coaxial, radio frequency.
DLA
Method
/ A
Cancelled
The purpose of this test is to measure the resistance between the drain and source of the field effect transistor or IGBT under the specified static condition.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the pulse response (td, tr, ts, and tf) of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The vibration test is used to determine the effects on component parts of vibration within the predominant frequency ranges and magnitudes that may be encountered...
DLA
Method
/
Active
This test is conducted for the purpose of determining the ability of component parts to withstand the dynamic stress exerted by random vibration applied between upper...
DLA
Method
/
Active