460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The barometric-pressure test is performed under conditions simulating the low atmospheric pressure encountered in the nonpressurized portions of aircraft and other...
DLA
Method
/
Active
This method establishes the means for measuring common mode input voltage range, common mode rejection ratio, and supply voltage rejection ratio.
DLA
Method
2 /
Active
The purpose of this test method is to measure rectification efficiency which is the ratio of dc output voltage to peak ac input voltage.
DLA
Method
2 / w/Change3
Active
The purpose of this test procedure is to measure gain, bandwidth, distortion, dynamic range, and input impedance. Gain, dynamic range, and distortion are combined into...
DLA
Method
2 /
Active
The purpose of this test method is to measure the temperature coefficient of breakdown voltage under specified conditions.
DLA
Method
1 / w/Change3
Active
The purpose of this test method is to check the semiconductor device capabilities under conditions simulating the low pressure encountered in the nonpressurized...
DLA
Method
4 / A w/Change4
Active
The purpose of this test is to measure the saturation current under the specified conditions.
DLA
Method
1 / w/Change3
Active
This appendix contains details for performance of the radiographic inspection for devices specified in accordance with this standard.
DLA
Method
/ C
Active
The purpose of this test method is to measure the voltage in the forward direction across the device under the specified conditions.
DLA
Method
1 / w/Change3
Active
The purpose of this test is to measure the RF power output, RF power gain, and collector efficiency of a transistor under actual operating conditions in a specific RF...
DLA
Method
/ w/Change1
Active