125 results found for MIL-STD-88
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This method establishes the means for measuring common mode input voltage range, common mode rejection ratio, and supply voltage rejection ratio.
DLA
Method
2 /
Active
The purpose of this test procedure is to measure gain, bandwidth, distortion, dynamic range, and input impedance. Gain, dynamic range, and distortion are combined into...
DLA
Method
2 /
Active
Latchup shall be performed in accordance with JEDEC JESD78. JEDEC JESD78 supersedes JEDEC-STD-17.
DLA
Method
2 /
Active
The purpose of this test method is to verify the workmanship of packaged devices. This test method shall also be utilized to inspect for damage due to handling,...
DLA
Method
14 /
Active
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to nonionizing energy loss (NIEL) degradation.
DLA
Method
3 /
Active
The thin film corrosion test is performed for the purpose of demonstrating the quality or reliability of devices subjected to the specified conditions over a specified...
DLA
Method
/
Active
The purpose of this method is to define a technique for assuring a conformance to a maximum or minimum mean of a parameter measured in any test method listed in...
DLA
Method
/
Active
This method establishes screening, qualification, and quality conformance requirements for the testing of complex monolithic microcircuits to assist in achieving the...
DLA
Method
4 /
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable
DLA
Method
/
Active
This method establishes the means for measuring power supply currents of digital microelectronic devices such as TTL, DTL, RTL, ECL, and MOS.
DLA
Method
1 /
Active