461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test method is to establish the capability of axial lead glass body diodes to be free of intermittents or opens when measured in the forward mode...
DLA
Method
2 / A w/Change5
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
MNFR
Detail / Drawing
J / -
Active
The purpose of this test is to measure the voltage between the collector and emitter of the device under specified conditions.
DLA
Method
/ w/Change1
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
This section describes detailed requirements for a DPA of commonly used microcircuits. These requirements supplement the general requirements in section 4.
DLA
Method
/ C
Active
This test is conducted for the purpose of detecting contact-chatter in electrical and electronic component parts having movable electrical contacts, such as relays,...
DLA
Method
/
Active
The purpose of this test is to measure the video resistance of the device.
DLA
Method
1 / w/Change3
Active
The purpose of this test finds out the length of time a device can survive a short-circuit condition. In some circuits, such as motor drives, it is necessary for a...
DLA
Method
/ w/Change1
Active
The purpose of this test method is to determined compliance with the specified lambda for semiconductor devices subjected to the specified conditions.
DLA
Method
5 / A w/Change4
Active