460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to visually inspect the internal materials, construction, and workmanship of hybrid, multichip and multichip module microcircuits.
DLA
Method
13 /
Active
The purpose of this test is to measure the ratio of the ac output power to the ac input power under the specified conditions (usually specified in dB) for small-signal...
DLA
Method
/ w/Change1
Active
This test procedure defines the requirements for measuring the dose rate response and upset threshold of packaged devices containing analog functions when exposed to...
DLA
Method
3 /
Active
The purpose of this test method is to determine compliance with the specified sample plan for semiconductor devices subjected to the specified conditions.
DLA
Method
/ A w/Change4
Active
Electronic and Electrical Component Parts: Voltage Coefficient of Resistance Determination Procedure
Certain types of resistors exhibit a variation of resistance with changes in voltage across the resistor. This is a measurable characteristic; a test to determine the...
DLA
Method
/
Active
This test is performed to determine the effectiveness of the seal of microelectronic devices.
DLA
Method
/
Active
The moisture resistance test is performed for the purpose of evaluating, in an accelerated manner, the resistance of semiconductor devices and constituent materials to...
DLA
Method
4 / A w/Change4
Active
The purpose of this test is to measure the resistance between the drain and source of the field effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to LOW level input load...
DLA
Method
1 /
Active
This method establishes the means for measuring MOSFET threshold voltage. This method applies to both enhancement-mode and depletion-mode MOSFETs, and for both silicon...
DLA
Method
/
Active