461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This test describes a means to cause current to flow alternately through the legs of a single-phase or three-phase bridge assembly under conditions to make it feasible...
DLA
Method
1 / w/Change1
Active
The variable-frequency-vibration test method is performed for the purpose of determining the effect on semiconductor devices of vibration in the specified frequency...
DLA
Method
3 / A w/Change5
Active
The purpose of this test method is to verify the workmanship of hermetically packaged semiconductor devices.
DLA
Method
10 / A w/Change5
Active
DLA
Detail / Drawing
D / -
Active
The purpose of this test is to determine if the breakdown voltage of the device under the specified conditions is greater than the specified minimum limit.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to determine the capabilities of the device to withstand pulses.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to verify the capability of a transistor to withstand pulses of specific voltage, current, and time, establishing a SOA.
DLA
Method
/ w/Change1
Active
The purpose of this test is to determine the drift of a parameter specified in the applicable specification sheet of the device.
DLA
Method
/ w/Change1
Active
The purpose of this test is to determine the effecrs of subjecting connectors or contacts to mating and unmating cycles simulating the expected life of such connectors.
DLA
Method
/ A
Cancelled
The purpose of this test is to measure the input admittance of the device under the specified conditions.
DLA
Method
/ w/Change1
Active