460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This method establishes a means for assuring circuit performance during cold temperature start up. It defines an activation time for digital microelectronic devices...
DLA
Method
1 /
Active
This test method is performed to determine whether termination leads and other component parts can withstand the effects of the heat to which they will be subjected...
DLA
Method
1 /
Active
This test method provides a classification system for, and means of measuring, air cleanliness.
DLA
Method
2 / w/Change1
Active
This test describes a means to cause current to flow alternately through the legs of a single-phase or three-phase bridge assembly under conditions to make it feasible...
DLA
Method
1 / w/Change1
Active
The variable-frequency-vibration test method is performed for the purpose of determining the effect on semiconductor devices of vibration in the specified frequency...
DLA
Method
3 / A w/Change5
Active
The purpose of this test method is to verify the workmanship of hermetically packaged semiconductor devices.
DLA
Method
10 / A w/Change5
Active
DLA
Detail / Drawing
D / -
Active
DDC’s discovered that a critical component used in the manufacturing of certain versions of DDC’s MIL-STD-1553 ACE Hybrids is obsolete
Obsolescence Documents
/
Active
The MFR performed a internal qualification in accordance with MIL-PRF-38534 Element Evaluation. Testing was performed per MIL-STD-750. No form, fit or function will be...
Alert Documents
- /
Active
The purpose of this test is to determine if the breakdown voltage of the device under the specified conditions is greater than the specified minimum limit.
DLA
Method
1 / w/Change1
Active