460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to output leakage current...
DLA
Method
/
Active
This test is to measure the resistance offered by the insulating members of a component part to an impressed direct voltage tending to produce a leakage of current...
DLA
Method
/ A w/Change4
Active
The purpose of this test is to determine the ability of a connector to comply with specified location and retention measurements through the use of location and...
DLA
Method
/ A
Cancelled
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to HIGH level input load...
DLA
Method
1 /
Active
This section describes detailed requirements for a DPA of commonly used transistors. These requirements supplement the general requirements in section 4
DLA
Method
/ C
Active
The purpose of this test is to measure the amount of electrical noise produced by the device under vibration.
DLA
Method
1 /
Active
The purpose of the test is to measure the forward transadmittance of the field effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active
The purpose of this test method is to establish a basic test circuit for the purpose of establishing forward transconductance (gFS) using pulsed dc for the test...
DLA
Method
2 / w/Change1
Active
The purpose of this test is to determine the straightness of contacts by qeasuring a total indicator reading (TIR) value.
DLA
Method
1 / A
Cancelled
This test method defines the procedure for testing integrated circuits under known test conditions for susceptibility to alpha induced errors.
DLA
Method
1 /
Active