461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test method is to measure the time between initiation (10 percentage point) of gate pulse and the time at which the output pulse is at 90 percent...
DLA
Method
/ w/Change3
Active
This method establishes screening, qualification, and quality conformance requirements for the testing of complex monolithic microcircuits to assist in achieving the...
DLA
Method
4 /
Active
The purpose of this test method is to define criteria for inspection of the dynamic reverse characteristics of rectifiers, switching, and zener diodes when viewed on a...
DLA
Method
2 / w/Change3
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable
DLA
Method
/
Active
Test conditions A, B, and C are performed to eliminate marginal semiconductor devices or those with defects resulting from manufacturing aberrations that are evidenced...
DLA
Method
4 / A w/Change4
Active
The purpose of this test method is intended to measure the forward voltage and recovery time of the semiconductor device.
DLA
Method
5 / w/Change3
Active
The purpose of this test is to detemine the connectors resistance to burning when exposed to a flame.
DLA
Method
/ A
Cancelled
The purpose of this test method is to determine compliance with the specified lambda for semiconductor devices subjected to the specified conditions.
DLA
Method
5 / A w/Change4
Active
This method establishes the means for measuring power supply currents of digital microelectronic devices such as TTL, DTL, RTL, ECL, and MOS.
DLA
Method
1 /
Active
The barometric pressure test is performed under conditions simulating the low atmospheric pressure encountered in the nonpressurized portions of aircraft and other...
DLA
Method
/
Active