125 results found for MIL-STD-883
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to verify that the amount of Lead (Pb) in Tin-Lead (Sn-Pb) alloys and electroplated finishes contain at least 3 weight percent (wt%) Lead...
DLA
Method
/
Active
The purpose of this test is to determine the strength of the element attachment system when subjected to force in the Y1 axis. This method is applicable to...
DLA
Method
2 /
Active
Test Site Transfer of RH, SMD, Class-S, Special flow and MIL-STD-883 products from Analog Devices Milpitas to Analog Devices General Trias (ADGT), Philippines
Alert Documents
- /
Active
total dose test of the IS-2981EH octal source driver. Parts were irradiated to 200 krad(Si) at low dose rate under biased and unbiased conditions as outlined in...
TD
/ 0
Active
The purpose of this examination is to verify that the external physical dimensions of the device are in accordance with the applicable acquisition document.
DLA
Method
/
Active
Environmental Test Method Standard for Microcircuits: Ionizing radiation (total dose) test procedure
This test procedure defines the requirements for testing packaged semiconductor integrated circuits for ionizing radiation (total dose) effects from a cobalt-60 (60Co)...
DLA
Method
9 /
Active
This method provides a test for determining the integrity of pin-grid type package leads by measuring the capability of the package leads to withstand an axial force.
DLA
Method
4 /
Active
HS1840ARH 16-channel. Parts were tested at low and high dose rate under biased and unbiased conditions as outlined in MIL-STD-883 Test Method 1019.7, to a maximum...
TD
/ 0
Active
total dose test of the HS-OP470ARH.Parts were tested at low and high dose rate under biased and unbiased conditions as outlined in MIL-STD-883 Test Method 1019.7,to a...
TD
/ 0
Active
The purpose of this test is to check the internal materials, construction, and workmanship of microcircuits for compliance with the requirements of the applicable...
DLA
Method
14 /
Active