461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
C / -
Active
DLA
Detail / Drawing
F / -
Active
The purpose of this test is to nondestructively detect defects within the sealed case of a semiconductor device, especially those resulting from sealing of the lid to...
DLA
Method
6 / A w/Change4
Active
This test method provides a means of judging the quality and acceptability of metallization on semiconductor dice.
DLA
Method
5 / A w/Change4
Active
The purpose of this test is to measure the dc potential between the specified, open-circuited terminal and reference terminal when a dc potential is applied to the...
DLA
Method
1 / w/Change1
Active
The purpose of this test is to determine the adequacy of receptacles and plugs (mated, unmated, or provided with protective covers) and wired-mated harnesses subjected...
DLA
Method
1 / A
Cancelled
The purpose of this test is to measure the drain reverse current of the field effect transistor or IGBT under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the resistance of mated connector contacts atanched to lengths of wire by measuring the millivolt drop across the contacts while...
DLA
Method
1 / A
Cancelled
MNFR
Detail / Drawing
- / -
Active