460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Qualify TeamQuest Technology, Inc.as an additional site for Burn-in and Group C High Temp Operating Life Test (HTOL) processes for Military and Aerospace products...
Alert Documents
/ D
Active
The purpose of this test is to verify the boundary of the Safe Operating Area (SOA) of a transistor as constituted by the interdependency of the specified voltage,...
DLA
Method
/ w/Change1
Active
This purpose of this test is to verify a desired junction temperature (TJ) is achieved during burn-in and life-test environments, and is conducted on a representative...
DLA
Method
/ w/Change1
Active
The purpose of this test method is to establish the capability of axial lead glass body diodes to be free of intermittents or opens when measured in the forward mode...
DLA
Method
2 / A w/Change5
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the voltage between the collector and emitter of the device under specified conditions.
DLA
Method
/ w/Change1
Active
The purpose of this test is to measure the cutoff current of the device under the specified conditions.
DLA
Method
1 / w/Change1
Active
This test is conducted for the purpose of determining the ability of the microcircuit; to withstand the dynamic stress exerted by random vibration applied between...
DLA
Method
/
Active
The purpose of this test is to measure the capacitance of component parts. Preferred test frequencies for this measurement are 60 Hz, 100 Hz, 120 Hz, 1 kHz, 100 kHz,...
DLA
Method
/
Active
The purpose of this test is to measure the pulse response (td(on), tr, td(off), tf) of power MOSFET or IGBT devices under specified conditions.
DLA
Method
2 / w/Change1
Active