460 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to determine the magnitude of the negative resistance under the specified conditions.
DLA
Method
/ w/Change3
Active
Failure analysis is a post mortem examination of failed devices employing, as required, electrical measurements and many of the advanced analytical techniques of...
DLA
Method
/
Active
The salt atmosphere test, in which specimens are subjected to a fine mist of salt solution, has several useful purposes when utilized with full recognition of its...
DLA
Method
/
Active
The purpose of this test method is to determine compliance with the specified sample plan for semiconductor devices subjected to the specified conditions.
DLA
Method
3 / A w/Change4
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to HIGH level output drive,...
DLA
Method
1 /
Active
This section describes detailed requirements for a DPA of commonly used RF devices. These requirements supplement the general requirements in section 4.
DLA
Method
/ C
Active
The purpose of this test method is to determine the small signal junction capacitance of the tunnel diode under the specified conditions.
DLA
Method
/ w/Change3
Active
This method establishes screening procedures for total lot screening of microelectronics to assist in achieving levels of quality and reliability commensurate with the...
DLA
Method
13 /
Active
This test procedure defines the detailed requirements for performing latchup testing of microcircuits to identify susceptibility to dose rate induced latchup.
DLA
Method
1 /
Active
The purpose of this test is to determine the ability of connectors to withstand the effects of controlled amounts of ozone.
DLA
Method
1 / A
Cancelled