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14721 results found for

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

V62/04647

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Microcircuit, Digital-Linear, 10-Bit Analog-to-Digital Converters, Monolithic Silicon
DLA
Detail / Drawing
A / -
Active

MIL-STD-750, Method 3433

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Transistor Electrical Test Methods for semiconductor Devices Part 3: Small-signal, common-source, short-circuit, reverse transfer capacitance
The purpose of this test is to measure the reverse transfer capacitance of the field effect transistor under the specified conditions.
DLA
Method
/ w/Change1
Active

LM118_NSC_Web

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Total Dose Radiation Test report
Total Dose Radiation Test report
TD
/
Active

MFR DS PE9309

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3,0-13,5 GHz Low Power UltraCMOS® Divide-by-4 Prescaler Radiation Tolerant for Space Applications
MNFR
Detail / Drawing
- / -
Active

MFR DS FN3573

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Radiation Hardened Quad Voltage Comparator, HS-139RH, HS-139EH
MNFR
Detail / Drawing
6.00 / -
Active

LM136_NSC_Web

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Total Dose Radiation Test report
Total Dose Radiation Test report
TD
/
Active

MFR DS T495 Series

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Solid Tantalum Chip Capacitors, T495 SERIES Low ESR, Surge Robust
MNFR
Detail / Drawing
- / -
Active

V62/04729

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Microcircuit, Digital, Advanced Bipolar CMOS, 3.3-V ABT Scan Test Device with 18-Bit Universal Bus Transceiver, Monolithic Silicon
DLA
Detail / Drawing
A / -
Active

MIL-PRF-123/22

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Capacitors, Fixed, Ceramic Dielectric, (Temperature Stable and General Purpose), High Reliability, Nonleaded, Style CKS56
DLA
Detail / Drawing
D / Det.Spec.&Am.1
Active

MIL-DTL-3950

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Switches, Toggle, Environmentally Sealed, General Specification for
DLA
Generic
L / -
Active