Please enter at least one character to search
Filters applied
Clear
Add filters to narrow your search
Filters applied
Clear
Document Filters

14814 results found for

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

MIL-PRF-3098/131

Download
Crystal Unit, Quartz, CR150_U
DLA
Detail / Drawing
F / -
Active

V62/09629

Download
Microcircuit, Digital, Fixed Point Digital Signal Processor, Monolithic Silicon
DLA
Detail / Drawing
A / -
Active

QPL-25676

Download
QPL-25676
QPL Documents
11 / -
Active

V62/04651

Download
Microcircuit, Linear, Dual_Quad, Rail to Rail, Low Power, Operational Amplifier Monolithic Silicon
DLA
Detail / Drawing
B / -
Active

MFR DS LTC2444/2445/2448/2449

Download
24-Bit High Speed 8-_16-Channel ΔΣ ADCs with Selectable Speed_Resolution
MNFR
Detail / Drawing
- / -
Active

MFR DS FN7957 EM

Download
Radiation Hardened Dual 36V Precision Single-Supply, Rail-to-Rail Output, Low-Power Operational Amplifiers, ISL70218SEH, ISL70218SRH
MNFR
Detail / Drawing
3.00 / -
Active

MIL-STD-202, Method 303

Download
Electronic and Electrical Component Parts: DC Resistance
The purpose of this test is to measure the direct-current (dc) resistance of resistors, electromagnetic windings of components, and conductors. It is not intended that...
DLA
Method
/
Active

V62/16601

Download
Microcircuit, Linear-Digital, Complete DDR2, DDR3 and DDR3L Memory Power Solution Synchronous Bus Controller, 2-A LDO, Buffered Reference, Monolithic Silicon
DLA
Detail / Drawing
B / -
Active

MIL-STD-750, Method 4051

Download
Diode Electrical Test Methods for Semiconductor Devices Part 4: Small-signal reverse breakdown impedance
The purpose of this test is to measure the reverse breakdown impedance of the device under smallsignal conditions.
DLA
Method
3 / w/Change3
Active

MFR DS RH0115

Download
1A 50-300V 35nsec Hyper Fast Rectifier
MNFR
Detail / Drawing
C / -
Active