14721 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
MNFR
Detail / Drawing
- / 06-08-2007
Active
MNFR
Detail / Drawing
1.3 / -
Active
This method established the means for measuring propagation delay of digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.
DLA
Method
1 /
Active
DLA
Detail / Drawing
B / Det.Spec.&Am.1
Active
DLA
Detail / Drawing
C / -
Active
DLA
Detail / Drawing
F / -
Active
This method establishes the means of measuring the series impedance of the ground and power supply circuit pin configurations for packages used for complex, wide...
DLA
Method
2 /
Active
MNFR
Detail / Drawing
E / -
Active