14721 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
A / -
Active
MNFR
Detail / Drawing
C1 / -
Active
DLA
Detail / Drawing
C / -
Active
The purpose of this test method is to determine compliance with the specified sample plan for semiconductor devices subjected to the specified conditions.
DLA
Method
3 / A w/Change4
Active
The low and high dose rate tests of the ISL7119EH are complete and showed no reject devices after irradiation to 150krad(Si) at low dose rate and 300krad(Si) at high...
TD
/ 0.00
Active
MNFR
Detail / Drawing
3 / -
Active
MNFR
Detail / Drawing
F / -
Active
MNFR
Detail / Drawing
E / -
Active