14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
E / Det.Spec.&Am.2
Active
DLA
Detail / Drawing
C / Det.Spec.&Am.1
Active
DLA
Detail / Drawing
C / Det.Spec.&Am.3
Active
MNFR
Detail / Drawing
- / 06-08-2007
Active
MNFR
Detail / Drawing
1.3 / -
Active
This method established the means for measuring propagation delay of digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.
DLA
Method
1 /
Active
DLA
Detail / Drawing
B / Det.Spec.&Am.1
Active