14688 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The vibration test is used to determine the effects on component parts of vibration within the predominant frequency ranges and magnitudes that may be encountered...
DLA
Method
/
Active
This test is conducted for the purpose of determining the ability of component parts to withstand the dynamic stress exerted by random vibration applied between upper...
DLA
Method
/
Active
Updated Microsemi wording and branding to Microchip throughout
Alert Documents
- /
Active
The part was tested for SEL/SEB/SEGR, using Au ions at zero degree incidence (LET = 86.4MeV•cm2/mg) SEFI tests conducted with Au ions were done with the samples at...
SEFI
/ 1
Active
MNFR
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
N / -
Active
DLA
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
D / -
Active