14688 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Parts were tested at low and high dose rate under biased and unbiased conditions at 0.01 rad(Si)/s and 65 rad(Si)/s respectively. The low dose rate test was run to 50...
TD
/ 0.00
Active
DLA
Detail / Drawing
B / Det.Spec.&Am.1
Active
The part is acceptance tested on a wafer-by-wafer basis to 300krad(Si) at High Dose Rate (HDR) (50-300rad(Si)/s) and to 50krad(Si) at LDR (0.01rad(Si)/s), ensuring...
TD
/ 1.00
Active
DLA
Detail / Drawing
D / -
Active
MNFR
Detail / Drawing
01/10/2006 / -
Active
DLA
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
- / -
Active
DLA
Detail / Drawing
B / -
Active