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14814 results found for

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

V62/16620

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Microcircuit, Linear-Digital, 24-Bit, 20 KHz, Low Power Analog-to-Digital Converter, Monolithic Silicon
DLA
Detail / Drawing
C / -
Active

V62/04738

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Microcircuit, Digital, Octal Bus Transceiver with 3-State Outputs, Monolithic Silicon
DLA
Detail / Drawing
C / -
Active

V62/11608

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Microcircuit, Digital, CMOS, ±% V_ +5V , 4 O, Single SPDT Switch, Monolithic Silicon
DLA
Detail / Drawing
A / -
Active

DWG_84148

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Connectors, Plugs and Receptacles, Electrical, Coaxial, Twinaxial and Triaxial, Radio Frequency
DLA
Detail / Drawing
E / -
Active

MIL-STD-750, Method 4141

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Diode Electrical Test Methods for Semiconductor Devices Part 4: Burnout by repetitive pulsing
The purpose of this test is to determine the capabilities of the device to withstand repetitive pulses.
DLA
Method
1 / w/Change3
Active

MFR SPEC ASD0010727

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Dual Ultra-Low VOS Matched Op Amp, OP207
ADI
Detail / Drawing
F / -
Active

MIL-DTL-55302/141

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Connectors, Printed Circuit Subassembly and Accessories: Plug with Pin Contacts, 3 Keying Pins, for Printed Wiring Boards (.100 Inch Spacing)
DLA
Detail / Drawing
C / -
Active

MIL-PRF-39006/31

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Capacitors, Fixed, Electrolytic (Non Solid), Tantalum, Established Reliability, Style CLR91
DLA
Detail / Drawing
E / -
Active

MIL-C-17/190

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Cable, Radio Frequency, Flexible, Coaxial, 50 Ohms, M17_190-00001
DLA
Detail / Drawing
B / -
Active

MIL-STD-883, Method 1011

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Environmental Test Method Standard for Microcircuits: Thermal shock
The purpose of this test is to determine the resistance of the part to sudden exposure to extreme changes in temperature and the effect of alternate exposures to these...
DLA
Method
9 /
Active