14721 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
C / -
Active
The purpose of this test method is to establish a basic test circuit for the purpose of establishing forward transconductance (gFS) using pulsed dc for the test...
DLA
Method
2 / w/Change1
Active
MNFR
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
C / -
Active
The part is acceptance tested on a wafer-by-wafer basis to 300krad(Si) at High Dose Rate (HDR) (50-300rad(Si)/s) and to 50krad(Si) at LDR (0.01rad(Si)/s), ensuring...
TD
/ 1.00
Active
MNFR
Detail / Drawing
19-Nov-2018 / -
Active
MNFR
Detail / Drawing
AC / -
Active
MNFR
Detail / Drawing
4 / -
Active