14696 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
C / -
Active
This test method provides a means of judging the relative resistance of glass encapsulated semiconductor devices to cracking under conditions of thermal stress. It...
DLA
Method
1 / A w/Change4
Active
MNFR
Detail / Drawing
1 / -
Active
MNFR
Detail / Drawing
1.00 / -
Active
MNFR
Detail / Drawing
7.00 / -
Active
TOTAL IONIZATION DOSE TEST REPORT (99T-RT54SX16-P05)
TD
/
Active
DLA
Detail / Drawing
C / -
Active
MNFR
Detail / Drawing
A / -
Active