14696 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
MNFR
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
B / Det.Spec.&Am.1
Active
DLA
Detail / Drawing
C / -
Active
This method provides various tests for determining the integrity of microelectronic device leads (terminals), welds, and seals.
DLA
Method
7 /
Active
DLA
Detail / Drawing
- / -
Active
MNFR
Detail / Drawing
- / -
Active
MNFR
Detail / Drawing
- / 3
Active
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
H / -
Active