14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to measure the amount of electrical noise produced by the device under vibration.
DLA
Method
1 /
Active
DLA
Detail / Drawing
C / -
Active
MNFR
Detail / Drawing
8 / -
Active
MNFR
Detail / Drawing
1 / -
Active
The test was conducted in order to determine the sensitivity of the part to Displacement Damage (DD) caused by neutron or proton environments in space. Neutron...
TD
/ 0.00
Active
The purpose of the test is to measure the forward transadmittance of the field effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active
DLA
Detail / Drawing
- / -
Active
Contains a .stp extension file with a E18-L26-8P 3D model
CAD
/
Active
MNFR
Detail / Drawing
3 / -
Active