14721 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR with all pins grounded. Three control...
TD
/ 0.00
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to output short circuit...
DLA
Method
1 /
Active
MNFR
Detail / Drawing
4 / -
Active
The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latchup (SEL) performance of the TL7700-SEP supply-voltage...
SEL
/
Active
DLA
Detail / Drawing
C / -
Active
DLA
Detail / Drawing
M / -
Active
DLA
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
C / -
Active