14814 results found for

The HS9-139RH is built in the Intersil RSG process, which has been shown to have moderate ELDRS sensitivity. The data shows a gradual increase of input bias current,...

This test method is designed to evaluate the short term leakage stability of semiconductor devices under reverse bias conditioning.

This method establishes a drive source to be used in measuring dynamic performance of digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.