14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
D / w/Amend. 2
Active
DLA
Detail / Drawing
B / -
Active
This method establishes the means for assuring circuit performance in regard to the test requirements necessary to verify the specified function and to assure that all...
DLA
Method
/
Active
DLA
Detail / Drawing
- / -
Active
MNFR
Detail / Drawing
A / -
Active
This method provides a means of judging the quality and acceptability of device interconnect metallization on non-planar oxide integrated circuit wafers or dice.
DLA
Method
6 /
Active
Low and high dose rate total dose tests of the ISL75051ASEH. Both irradiations were followed by a 168-hour anneal at 100°C under bias. All tested SMD parameters passed...
TD
/ 0.00
Active