14721 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
MNFR
Detail / Drawing
F / -
Active
ADI
Detail / Drawing
U / -
Active
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
- / -
Active
The purpose of this test method establishes a baseline methodology for characterizing high-voltage transistors to high gamma dose rate radiation and for establishing...
DLA
Method
/ w/Change1
Active
MNFR
Detail / Drawing
I / -
Active
DLA
Detail / Drawing
A / -
Active