14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
- / -
Active
MNFR
Detail / Drawing
F / -
Active
MNFR
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
A / -
Active
The purpose of this test method is to determine if the breakdown voltage of the semiconductor device is greater than the specified minimum limit.
DLA
Method
2 / w/Change3
Active
This test method is designed to measure the breakdown voltage of voltage regulator and voltage-reference semiconductor devices under the specified conditions.
DLA
Method
/ w/Change3
Active
DLA
Detail / Drawing
H / Det.Spec.&Am.1
Active
MNFR
Detail / Drawing
A / -
Active
All samples passed the SMD criteria through their respective maximum total dose exposure, which was 50krad(Si) for the biased low dose rate samples and 150krad(Si) for...
TD
/ 0
Active