| doEEEt

All samples in the low dose rate test showed stable performance to 50krad(Si), but at the 100krad(Si) downpoint a failure was encountered in the grounded irradiation...

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MIL-DTL-55302/93

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Connectors, Printed Circuit Subassembly and Accessories: Plug, Insert (Insulator), Rectangular, Polarized, Removable Crimp Type, Hermaphroditic Contacts (.100 Inch Spacing)

DLA

Detail / Drawing

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ESCC 3001/040

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Capacitors, Fixed, Ceramic Dielectric, Type 1 N2200, High Voltage 200V to 5000V, based on types C480PS to C485PS, C480PLS to C485PLS, C480LS to C485LS, C480RS to C485RS

ESCC

Detail / Drawing

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MFR DS MAX4617/4618/4619

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High-Speed, Low-Voltage, CMOS Analog Multiplexers_Switches

MNFR

Detail / Drawing

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MIL-STD-202, Method 110

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Electronic and Electrical Component Parts: Sand and Dust

The dust test is used during the development, test, and evaluation of equipment to ascertain their ability to resist the effects of a dry dust (fine sand) laden...

DLA

Method

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