14688 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test method is to determine the small signal junction capacitance of the tunnel diode under the specified conditions.
DLA
Method
/ w/Change3
Active
C&K Components has engaged a program around CCM01-MK5 series. This program consists of improvements related to the part numbering and designation update for the...
Alert Documents
B /
Active
DLA
Detail / Drawing
D / Det.Spec.&Am.1
Active
DLA
Detail / Drawing
H / -
Active
DLA
Detail / Drawing
C / w/Amend. 3
Active
DLA
Detail / Drawing
E / -
Active
This method establishes screening procedures for total lot screening of microelectronics to assist in achieving levels of quality and reliability commensurate with the...
DLA
Method
13 /
Active