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14721 results found for

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

V62/09604

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Microcircuit, Digital, Dual Bit, Dual Supply Bus Transceiver with Configurable Voltage Translation and 3-State Outputs, Monolithic Silicon
DLA
Detail / Drawing
A / -
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MIL-STD-750, Method 3453

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Transistor Electrical Test Methods for semiconductor Devices Part 3: Small-signal, common-source, short-circuit, output admittance
The purpose of this test is to measure the output admittance of the field-effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
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Total ionization HS9S-117RH
The HS9S-117RH is built in the Intersil RSG process, which has been shown to have moderate ELDRS sensitivity. The data shows excellent stability of the reference...
TD
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MFR DS OMH360

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High Reliability Hallogic Hall Effect Sensor Types OMH360B, OMH360S
MNFR
Detail / Drawing
01/06/1996 / -
Active

GSFC-311-QPLD

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GSFC-311-QPLD
QPL Documents
032 / -
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MFR DS SY89295U

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22.5V_3.3V 1.5GHz Precision LVPECL Programmable Delay
MNFR
Detail / Drawing
- / -
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MFR DS FN4653

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Radiation Hardened Programmable Low Power Op Amps, HS-3530ARH, HS-3530AEH
MNFR
Detail / Drawing
4 / -
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NOT LISTED IN QPL

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NOT LISTED IN QPL
QPL Documents
- / -
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QPDSIS-49465

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QPDSIS-49465
QPL Documents
06-Jan-22 / -
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MIL-DTL-38999/40

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Connectors, Electrical, Circular, Receptacle, Wall Mounting Flange, Breech Coupling, Removable Crimp
DLA
Detail / Drawing
B / Det.Spec.&Am.1
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