208 results found for MIL-STD-750
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to verify the capability of a transistor to withstand switching between saturation and cutoff for various specified loads, establishing a SOA.
DLA
Method
/ w/Change1
Active
The purpose of this test method is to measure the amount of electrical noise produced by the semiconductor device under vibration.
DLA
Method
1 / A w/Change5
Active
The purpose of this test is to qualify the ability of a surface mount package of a semiconductor device to withstand the stresses developed by a thermal mismatch (due...
DLA
Method
/ A w/Change4
Active
The purpose of this test is to measure the drain reverse current of the field effect transistor or IGBT under the specified conditions.
DLA
Method
1 / w/Change1
Active
This test is performed to eliminate marginal semiconductor devices or those with defects resulting from manufacturing aberrations that are evidenced as time and stress...
DLA
Method
4 / A w/Change4
Active
The purpose of this test is to measure the reverse transfer capacitance of the field effect transistor under the specified conditions.
DLA
Method
/ w/Change1
Active
These procedures and criteria shall address probe testing and lot acceptance testing, element evaluation or equivalent for each wafer, or wafer lot as applicable...
DLA
Method
2 / w/Change1
Active
The purpose of this test is to measure the output admittance of the field-effect transistor under the specified small-signal conditions.
DLA
Method
/ w/Change1
Active
The purpose of this test is to measure the reverse blocking current under the specified conditions, using the dc method or the ac method, as applicable.
DLA
Method
1 / w/Change3
Active
The purpose of this test method is to measure the quality factor (Q) of the device. By definition, Q expresses the ratio of reactance to effective resistance of the...
DLA
Method
1 / w/Change3
Active