871 results found for 3009
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
B / Det.Spec.&Am.2
Active
DLA
Detail / Drawing
- / -
Active
Total ionization dose (TID), single-event upset (SEU) and single-event latch-up (SEL) of a new 28 nm SONOS-based field-programmable gate-array (FPGA) are tested by...
TD
/
Active
ESCC
Detail / Drawing
2 /
Active
DLA
Detail / Drawing
- / -
Active
DLA
Detail / Drawing
E / -
Active
DLA
Detail / Drawing
C / -
Active
DLA
Detail / Drawing
C / -
Active