871 results found for 3009
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
H / Det.Spec.&Am.1
Active
Total ionization dose (TID), single-event upset (SEU) and single-event latch-up (SEL) of a new 28 nm SONOS-based field-programmable gate-array (FPGA) are tested by...
SEL
/
Active
DLA
Detail / Drawing
H / w/Amend.3
Active
DLA
Detail / Drawing
D / -
Active
DLA
Detail / Drawing
H / -
Active
Total ionization dose (TID), single-event upset (SEU) and single-event latch-up (SEL) of a new 28 nm SONOS-based field-programmable gate-array (FPGA) are tested by...
SEU
/
Active