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300 results found for MIL-STD-883 Method 2006

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

MIL-STD-883, Method 2006

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Mechanical Test Method Standard for Microcircuits: Vibration noise
The purpose of this test is to measure the amount of electrical noise produced by the device under vibration.
DLA
Method
1 /
Active

MFR DS CO-441

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CO-441 HCMOS, ACMOS and FCT Clock Oscillators
MNFR
Detail / Drawing
- / -
Active

ELDRS announcement (July-2006)

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NSC announces the release of ELDRS Free BiPolar Analog Products
NSC announces the release of ELDRS Free BiPolar Analog Products
RAD
/
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ESCC 9202/042

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CMOS Quad 3-State NOR R_S Latches, based on type 4043B
ESCC
Detail / Drawing
5 / -
Active

ESCC 9205/021

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HCMOS 3-Line to 8-Line Decoders_Demultiplexers with Address Latches, based on type 54HC237
ESCC
Detail / Drawing
5 / -
Active

ESCC 9204/020

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CMOS Decade Counter_Divider, based on type 4017B
ESCC
Detail / Drawing
6 / -
Active

ESCC 9408/054

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HCMOS 8-to-1-Line Data Selectors_Multiplexers with fully buffered outputs, based on type 54HC151
ESCC
Detail / Drawing
5 / -
Active

ESCC 9204/052

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CMOS 14-Stage Ripple-Carry Binary Counter_Divider and Oscillator, based on type 4060B
ESCC
Detail / Drawing
6 / -
Active

ESCC 9401/037

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Integrated Circuits, Silicon Monolithic, HCMOS Hex Buffer_Converter with Fully Buffered Inverted Outputs, Based on type 54HC4049
ESCC
Detail / Drawing
6 / -
Active

MIL-PRF-27/368

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Inductor, Power, Surface Mount
DLA
Detail / Drawing
B / -
Active