154 results found for MIL-STD-750 method 1022
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test method is to verify that the markings will not become illegible on the semiconductor devices when subjected to solvents.
DLA
7 / A w/Change4
Active
This test method describes detail procedures and evaluation guidelines for the destructive physical analysis (DPA) of commonly specified diodes.
DLA
5 / A w/Change4
Active
The purpose of this test method is to determine the hermeticity of semiconductor devices with designed internal cavities.
DLA
16 / A w/Change4
Active
DLA
Detail / Drawing
F / -
Active
DLA
Detail / Drawing
D / -
Active
DLA
Detail / Drawing
C / -
Active
DLA
Detail / Drawing
R / w/Amend. 2
Active
JAXA
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
D / -
Active