19 results found for MIL-STD-750 Method 2051
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test method is to measure the amount of electrical noise produced by the semiconductor device under vibration.
DLA
1 / A w/Change5
Active
The purpose of this test is to determine the shear strength of the seal of glass-frit-sealed microelectronic packages. This is a destructive test.
DLA
2 /
Active
DLA
Detail / Drawing
H / -
Active
DLA
Detail / Drawing
F / -
Active
Total Dose Radiation Test report
TD
/
Active
DLA
Detail / Drawing
E / -
Active
DLA
Detail / Drawing
G / -
Active
DLA
Detail / Drawing
L / -
Active
DLA
Generic
K / w/Amend.1
Active
DLA
Detail / Drawing
J / w/Amend.2
Active