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168 results found for MIL-STD-750 Method 2016

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MIL-STD-750, Method 2016

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Mechanical Test Methods for Semiconductor Devices Part 2: Shock
This test method is intended to determine the ability of the semiconductor devices to withstand moderately severe shocks such as would be produced by...
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Method
2 / A w/Change5
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MIL-PRF-19978/15

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Capacitors, Fixed, Plastic Dielectric, Axial-Wire Terminal, Threaded-Stud Retainer, Tubular (Uninsulated) (Hermetically Sealed in Metal Cases), Established Reliability, Style CQR33
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MIL-PRF-19978/8

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CAPACITORS, FIXED, PLASTIC DIELECTRIC, AXIAL-WIRE TERMINAL,TUBULAR (INSULATED) (HERMETICALLY SEALED IN METAL CASES),ESTABLISHED RELIABILITY, STYLE CQR07
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MIL-PRF-19500

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Semiconductor Devices, General Specification for
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Generic
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MIL-PRF-19978/14

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Capacitors, Fixed, Plastic Dielectric, Axial-Wire Terminal, Tangential Retainer, Tubular (Uninsulated) (Hermetically Sealed in Metal Cases), Established Reliability, Style CQR32
DLA
Detail / Drawing
B / -
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MIL-PRF-19978/11

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Capacitors, Fixed, Plastic (or Paper-Plastic) Dielectric, Axial-Wire Terminal-Stud Retainer, Tubular (Uninsulated) (Hermetically Sealed in Metal Cases), Established Reliability, Style CQR13
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Detail / Drawing
D / -
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DWG_90024

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Semiconductor Device, Power Switching Regulator Assembly
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Detail / Drawing
D / -
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MIL-PRF-19500/605

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Semiconductor Device, Field Effect Radiation Hardened (Total Dose Only) Transistors, N-Channel, Silicon Types 2N7292, 2N7294, 2N7296, and 2N7298 JANTXVM, D, R, H and JANSM, D and R
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MIL-PRF-19500/601

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Semiconductor Device, Field Effect Radiation Hardened (Total Dose Only) Transistors, N-Channel, Silicon, Types 2N7261 and 2N7262 and U Suffixes, JANTXVR, F, G, and H and JANSR, F, G, and H
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MIL-PRF-19978/10

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Capacitors, Fixed, Plastic (or Paper-Plastic) Dielectric, Axial-Wire Terminal, Tangential Retainer, Tubular (Uninsulated) (Hermetically Sealed in Metal Cases), Established Reliability, Style CQR12
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