Please enter at least one character to search
Filters applied
Clear
Add filters to narrow your search
Filters applied
Clear
Document Filters

31 results found for MIL-STD 883 method 2026

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

MIL-STD-883, Method 2026

Download
Mechanical Test Method Standard for Microcircuits: Random vibration
This test is conducted for the purpose of determining the ability of the microcircuit; to withstand the dynamic stress exerted by random vibration applied between...
DLA
Method
/
Active

MFR DS QPDS-0106 EM

Download
Ultra Space OCXO, Ultra Miniature, Ultra Rugged, Ultra Stable, Q-TECH QT4200
MNFR
Detail / Drawing
C / -
Active

MFR DS QPDS-0008 EM

Download
Low Phase Noise, Space Level OCXO, Q-TECH QT4100
MNFR
Detail / Drawing
B / -
Active

MFR DS QPDS-0008

Download
Low Phase Noise, Space Level OCXO, Q-TECH QT4100
MNFR
Detail / Drawing
B / -
Active

MFR DS QPDS-0001

Download
High Reliability Hybrid Crystal Clock Oscillators, Q-TECH Class B+ Products
MNFR
Detail / Drawing
U / -
Active

MFR DS QPDS-0106

Download
Ultra Space OCXO, Ultra Miniature, Ultra Rugged, Ultra Stable, Q-TECH QT4200
MNFR
Detail / Drawing
C / -
Active

MIL-PRF-38534

Download
Hybrid Microcircuits, General Specification for
DLA
Generic
L / -
Active

MFR DS QPDS-0001 EM

Download
High Reliability Hybrid Crystal Clock Oscillators, Q-TECH Class B+ Products
MNFR
Detail / Drawing
U / -
Active

MIL-PRF-55310

Download
Oscillator, Crystal Controlled, General Specification For
DLA
Generic
F / Gen.Spec.&Am.1
Active

MIL-PRF-19500/702

Download
Semiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistor, N-Channel, Silicon, Types 2N7482T3, 2N7483T3, and 2N7484T3, JANTXVR, F, G, and H and JANSR, F, G, and H
DLA
Detail / Drawing
E / Det.Spec.&Am.1
Active