461 results found for MIL-STD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test is to determine the adequacy of receptacles and plugs (mated, unmated, or provided with protective covers) and wired-mated harnesses subjected...
DLA
Method
1 / A
Cancelled
The purpose of this test is to measure the drain reverse current of the field effect transistor or IGBT under the specified conditions.
DLA
Method
1 / w/Change1
Active
The purpose of this test is to measure the resistance of mated connector contacts atanched to lengths of wire by measuring the millivolt drop across the contacts while...
DLA
Method
1 / A
Cancelled
MNFR
Detail / Drawing
- / -
Active
This test is performed to eliminate marginal semiconductor devices or those with defects resulting from manufacturing aberrations that are evidenced as time and stress...
DLA
Method
4 / A w/Change4
Active
The purpose of this test is to measure the reverse transfer capacitance of the field effect transistor under the specified conditions.
DLA
Method
/ w/Change1
Active
Endurance life is performed in order to demonstrate the quality and reliability of nonvolatile memory devices subjected to repeated write/erase cycles.
DLA
Method
/
Active
Electrical Test Method Standard for Microcircuits: Input offset voltage and current and bias current
This method establishes the means for measuring input bias current and the offset in voltage and current at the input of a linear amplifier with differential inputs....
DLA
Method
1 /
Active
This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to terminal capacitance....
DLA
Method
1 /
Active
This section describes detailed requirements for a DPA of commonly used thermistors. These requirements supplement the general requirements in section 4.
DLA
Method
/ C
Active