2003 results found for JEDEC STANDARD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Latchup shall be performed in accordance with JEDEC JESD78. JEDEC JESD78 supersedes JEDEC -STD-17.
DLA
Method
2 /
Active
DLA
Detail / Drawing
01/09/1984 / -
Active
DLA
Generic
A / -
Active
The purpose of this test is to verify that the amount of Lead (Pb) in Tin-Lead (Sn-Pb) alloys and electroplated finishes contain at least 3 weight percent (wt%) Lead...
DLA
Method
/
Active
The purpose of this test is to measure bond strengths, evaluate bond strength distributions, or determine compliance with specified bond strength requirements of the...
DLA
Method
10 /
Active
This method establishes qualification and quality conformance inspection procedures for microelectronics to assure that the device and lot quality conforms with the...
DLA
Method
17 /
Active
This method establishes screening, qualification, and quality conformance requirements for the testing of complex monolithic microcircuits to assist in achieving the...
DLA
Method
4 /
Active
This report provides the compliance matrix between the ECSS-Q-ST-60-13C standard against the Extended Lot Acceptance Test specifically implemented for...
Qualification Report
/
Active
DLA
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
A / -
Active