2003 results found for JEDEC STANDARD
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
MNFR
Detail / Drawing
- / -
Active
MNFR
Detail / Drawing
Sep 2016 / -
Active
The purpose of this test method is to subject the device under test (DUT) to high current stress conditions to determine the ability of the device chip and contacts to...
DLA
Method
6 / w/Change3
Active
MNFR
Detail / Drawing
F / -
Active
MNFR
Detail / Drawing
4 / -
Active
MNFR
Detail / Drawing
F / -
Active
MNFR
Detail / Drawing
3 / -
Active
DLA
Detail / Drawing
K / -
Active