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2003 results found for JEDEC STANDARD

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

V62/04685

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Microcircuit, Linear, Quadruple 2-Input Positive NAND Gate, Monolithic Silicon
DLA
Detail / Drawing
C / -
Active

V62/04686

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Microcircuit, Digital, Quadruple 2-Input Positive and Gate, Monolithic Silicon
DLA
Detail / Drawing
C / -
Active

MIL-STD-750, Method 3100

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Transistor Electrical Test Methods for semiconductor Devices Part 3: Test Method Junction temperature measurement at burn-in and life test
This purpose of this test is to verify a desired junction temperature (TJ) is achieved during burn-in and life-test environments, and is conducted on a representative...
DLA
Method
/ w/Change1
Active

V62/18601

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Microcircuit, Linear-Digital, Dual Core Microcontrollers, Monolithic Silicon
DLA
Detail / Drawing
- / -
Active

V62/09611

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Microcircuit, Digital, Controller Area Network (CAN) Transceiver, Monolithic Silicon
DLA
Detail / Drawing
B / -
Active

V62/07612

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Microcircuit, Digital-Linear, High Speed Differential LineDrivers and Receivers, Monolithic Silicon
DLA
Detail / Drawing
B / -
Active

MFR DS DS00003669

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RTG4 Radiation-Tolerant FPGAs
MNFR
Detail / Drawing
B / -
Active

MFR DS DS00003669 EM

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RTG4 Radiation-Tolerant FPGAs
MNFR
Detail / Drawing
B / -
Active

MFR DS SCES643

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TXB0108 8-Bit Bidirectional Voltage-Level Translator with Auto-Direction Sensing and ±15-kV ESD Protection
MNFR
Detail / Drawing
H / -
Active

ESCC 9030

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Generic Specification for Integrated Circuits: Monolithic Microcircuits, Wire-Bonded, Plastic Encapsulated and Flip-Chip Monolithic Microcircuits, with Organic Substrate
ESCC
Generic
2 / -
Active