269 results found for MIL-STD-883 method 2018
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
All parameters remained well within the SMD limits at all downpoints and showed no differences in total dose response between low and high dose rate or between biased...
TD
/ 0.00
Active
MNFR
Detail / Drawing
E / -
Active
MNFR
Detail / Drawing
14 / -
Active
The low and high dose rate tests of the ISL7119EH are complete and showed no reject devices after irradiation to 150krad(Si) at low dose rate and 300krad(Si) at high...
TD
/ 0.00
Active
Low and high dose rate total dose tests of the ISL75051ASEH. Both irradiations were followed by a 168-hour anneal at 100°C under bias. All tested SMD parameters passed...
TD
/ 0.00
Active
MNFR
Detail / Drawing
L / -
Active
24 samples irradiated under bias and 24 samples irradiated with all pins grounded. All tested SMD parameters passed at all downpoints. No bias or anneal sensitivity...
TD
/ 1.00
Active
Low and high dose rate total dose tests of the ISL75051ASEH. Both irradiations were followed by a 168-hour anneal at 100°C under bias. All tested SMD parameters passed...
TD
/ 0.00
Active
This report covers the radiation characterization results of the TPS73801-SEP Low-Dropout Regulator.
TD
A /
Active
This report covers the radiation characterization results of the TLV1704-SEP, 2.2-V to 36-V microPower comparator.
TD
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Active