267 results found for MIL-STD-883 method 2018
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR with all pins grounded. Three control...
TD
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Active
10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR with all pins grounded. Three control...
TD
/ 0.00
Active
10 samples irradiated at LDR under bias,10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR...
TD
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Active
MNFR
Detail / Drawing
0 / -
Active
All parameters remained well within the SMD limits at all downpoints and showed no differences in total dose response between low and high dose rate or between biased...
TD
/ 0.00
Active
The results of the LDR and HDR total dose tests of the ISL70591SEH. All tested SMD parameters passed at all downpoints. No dose rate or bias sensitivity was observed.
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Active
The low and high dose rate tests of the ISL7119EH are complete and showed no reject devices after irradiation to 150krad(Si) at low dose rate and 300krad(Si) at high...
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Active
All parameters remained well within the SMD limits at all downpoints and showed no differences in total dose response between low and high dose rate or between biased...
TD
/ 0.00
Active
Low and high dose rate total dose tests of the ISL75051ASEH. Both irradiations were followed by a 168-hour anneal at 100°C under bias. All tested SMD parameters passed...
TD
/ 0.00
Active