269 results found for MIL-STD-883 method 2018
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR with all pins grounded. Three control...
TD
/ 0.00
Active
10 samples irradiated at LDR under bias,10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR...
TD
/ 0.00
Active
DLA
Generic
E / Gen.Spec.&Am.4
Active
Parts were irradiated under bias and with all pins grounded at LDR and HDR at 0.01rad(Si)/s and 71.9rad(Si)/s respectively. All irradiations were followed by a high...
TD
/ 1.00
Active
MNFR
Detail / Drawing
0 / -
Active
10 samples irradiated at LDR under bias,10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR...
TD
/ 0.00
Active
All parameters remained well within the SMD limits at all downpoints and showed no differences in total dose response between low and high dose rate or between biased...
TD
/ 0.00
Active
The results of the LDR and HDR total dose tests of the ISL70591SEH. All tested SMD parameters passed at all downpoints. No dose rate or bias sensitivity was observed.
TD
/ 0.00
Active
The low and high dose rate tests of the ISL7119EH are complete and showed no reject devices after irradiation to 150krad(Si) at low dose rate and 300krad(Si) at high...
TD
/ 0.00
Active