267 results found for MIL-STD-883 method 2018
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
Parts were irradiated under bias and with all pins grounded at low dose rate and under bias at high dose rate perat 0.01rad(Si)/s and 50rad(Si)/s respectively. The low...
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Parts were tested at LDR under biased and unbiased conditions and at HDR under biased conditions as part of routine production acceptance testing, to a total dose of...
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Parts were tested at low and high dose rate under biased and unbiased conditions at 0.01 rad(Si)/s and 65 rad(Si)/s respectively. The low dose rate test was run to 50...
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Parts were tested at low and high dose rate under biased and unbiased conditions at 0.01 rad(Si)/s and 65 rad(Si)/s respectively. The low dose rate test was run to 50...
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MNFR
Detail / Drawing
3 / -
Active
Parts were irradiated under bias and with all pins grounded at LDR and HDR at 0.01rad(Si)/s and 71.9rad(Si)/s respectively. All irradiations were followed by a high...
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10 samples irradiated at LDR under bias,10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR...
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The results of the LDR and HDR total dose tests of the ISL70591SEH. All tested SMD parameters passed at all downpoints. No dose rate or bias sensitivity was observed.
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10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR with all pins grounded. Three control...
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10 samples irradiated at LDR with all pins grounded, 5 samples irradiated at HDR under bias, and 4 samples irradiated at HDR with all pins grounded. Three control...
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/ 0.00
Active